Contact Us
Contact Us
Products
▾
Thickness and Flaw Inspection Solutions
▾
Flaw Detectors / Phased Array Flaw Detectors
▾
Ultrasonic Flaw Detectors
Phased Array
Eddy Current Products
Eddy Current Array Products
Bond Testing
Thickness Gauges
▾
72DL PLUS
39DL PLUS
45MG
Magna-Mike 8600
27MG
35RDC
Transducers and Accessories
Transducers and Probes
▾
Single and Dual Element Transducers
Eddy Current Probes
Probes for Tube Inspection
Phased Array Probes
BondMaster Probes
Automated Inspection Systems
▾
Wheel Inspection
Wheelset Inspection System (PASAWIS)
Bar Inspection Solutions
Tube Inspection
Friction Stir Weld Inspection
Pipeline Girth Weld Inspection
NDT Systems Instrumentation
▾
FOCUS PX / PC / SDK
QuickScan
QuickScan iX ECA
QuickScan iX PA+
NDT Industrial Scanners
▾
Weld Inspection Scanners
Corrosion Inspection Scanners
Aerospace/Wind Blade Inspection Scanners
Scanner Accessories
Evident Connect
▾
X3 RCS
Inspection Project Manager (IPM)
Software
▾
WeldSight™ Software
TomoView Software
NDT SetupBuilder Software
OmniScan MX2 and SX Software
OmniPC 4 Software
ScanPlan Software
AeroView™ Software
XRF Analysis
▾
Portable and Handheld XRF Analyzers
▾
Vanta Max and Vanta Core
Vanta Element
Showroom and Benchtop XRF Analyzers
▾
Vanta GX
In-Line XRF Analysis
Positive Material Identification Equipment
▾
X-STREAM
Applications and Solutions Key
Evident Connect
▾
Vanta Data Viewer
Industrial Microscopes
▾
Laser Confocal Microscopes
▾
OLS5100
ISO/IEC 17025校正認定ソリューション
表面粗さ測定ポータル
Digital Microscopes
▾
DSX1000
ISO/IEC 17025校正認定ソリューション
Measuring Microscopes
▾
STM7
STM7-BSW
Cleanliness Inspector
▾
CIX100
Light Microscopes
▾
Upright Microscopes
Inverted Microscopes
Modular Microscopes
Semiconductor Wafer & Flat Panel Display Inspection Microscopes
▾
MX63 / MX63L
AL120
AL120-12
AR Microscopes
▾
SZX-AR1
Industrial Stereo Microscopes
▾
SZX16
SZX10
SZX7
SZ61/SZ51
Digital Cameras
▾
DP75
DP28
SC180
DP23
LC35
DP23M
Image Analysis Software
▾
PRECiV
Stream Enterprise
Micro Spectrophotometer
▾
USPM-RU-W
Microscope Objective Lenses for Industry
▾
MPLAPON
MPLAPON-Oil
MXPLFLN
MXPLFLN-BD
MPLN
MPLN-BD
MPLFLN
MPLFLN-BD
LMPLFLN
LMPLFLN-BD
SLMPLN
LCPLFLN-LCD
LMPLN-IR/LCPLN-IR
White Light Interferometry Objective
Micrometer
OEM Microscope Components for Integration
Industrial Microscope FAQ
Customized Solutions
Customized Solutions
Videoscopes and Borescopes
▾
Video Borescopes
▾
IPLEX NX
IPLEX GAir
IPLEX GX/GT
IPLEX G Lite and IPLEX G Lite-W
IPLEX TX II
IPLEX Long Video Borescope Solution
Wind Turbine Inspection Video Borescopes
Aviation Borescopes for Aircraft Inspection
Video Borescopes for Automotive Engine Inspection
Fiberscopes
▾
Small-Diameter Fiberscopes
Sweeney Digital Turning Tool
Video Borescope Software
▾
InHelp
3DAssist 3D Modeling Software
Borescope Light Sources
Evident Connect
▾
ViSOL
Industries
Resources
Learn
Blog
Support
▾
Contact Us
Consultation Reception about Introduction
Customer Service
XRF and XRD Technical Support
Service Solutions
▾
Overview
Service Centers
Custom Financing Solutions
Olympus Scientific Cloud
Software Downloads
User Manuals
ISO Certifications
MSDS Datasheets
Compliance and Ethics at Evident
Product Information
Product Service Termination List
Discontinued and Obsolete Products
▾
MultiScan MS5800
▾
MultiView Software
TubePro Software
CIC
Evident Technolab
Microscope Classroom
EVIDENT Modern Slavery Act Statement
APAC Technology Center
▾
Overview
Automated Multi-Element XRF Analysis
▾
Overview
Microscope Inspection System
▾
Overview
Bolt Inspection Scanner
▾
Overview
Simplified Data Transfer and Management
▾
Overview
Rentals
Shop
Careers
What is EVIDENT?
Search
My Account
IMS Log in
Evident Connect Log in
Log Out
Log Out
English (English)
|
简体中文 (Simplified Chinese)
Industrial Solutions
Careers
Careers
Recent News
Home
/
Press
2024
|
2023
|
2022
|
2021
|
2020
|
2019
|
2018
|
2017
|
2016
|
2015
|
2014
|
2013
|
2012
|
2011
|
2010
|
2009
|
2008
|
2007
|
2006
News
11
Nov
Olympus LEXT™ OLS5100 Laser Microscope’s Smart Features Empower Faster Experiment Workflows
14
Oct
Olympus and Hellier NDT Extend Collaboration to Train Future NDT Inspectors
25
Aug
Training the Next-Generation of NDT Inspectors in FMC/TFM
04
Aug
Olympus and Metal Analysis Group to Deliver API RP 578 Training
07
Jul
The AxSEAM™ Scanner Simplifies Longitudinal Seam Weld Inspection
23
Jun
Olympus Supports Student Success at San Jacinto College with Ultrasonic Testing Equipment Donation
18
Jun
Advanced Optical Metrology: New expertly curated content hub launched
17
Jun
Improved Quality Control for Steel Manufacturers
26
May
Vanta Element-S XRF Analyzer Offers Fast, Affordable Light Element Detection
19
May
Vanta™ Data Viewer App Simplifies XRF Data Sharing
15
Apr
IPLEX™ NX Working Channel Solution Features Six Internal Retrieval Tools to Expand the Videoscope’s Capabilities
23
Mar
Olympus Scientific Cloud™ v. 3.0 Delivers Even More Value to Olympus Connected Inspection and Analytical Devices with Powerful Tools and Free Features
10
Mar
Olympus Supports FMC/TFM Training with OmniScan™ X3 Flaw Detectors
Sorry, this page is not available in your country
Let us know what you're looking for by filling out the form below.
Contact Us
Subscribe to the Evident email
Social News
Olympus IMS
Home
/
Press
Print
Search
Cancel
Redirecting
You are being redirected to our local site.
Attention: Please enable JavaScript
Sorry, this page is not available in your country