Webinar: Acoustic Influence Map (AIM)—The Modeling Tool for Your TFM Inspection

Olympus OmniScan X3 Phased Array Flaw Detector

See how the AIM modeling tool and its Sensitivity Index feature show users which TFM wave sets and probe will be most effective for a given application.

Presenter:
Emilie Peloquin, Global Advanced Product Support Manager
Olympus Scientific Solutions Americas (OSSA)

Acoustic Influence Map (AIM)—The Modeling Tool for Your TFM Inspection

See how the AIM modeling tool and its Sensitivity Index feature show users which TFM wave sets and probe will be most effective for a given application.

Presenter:

Emilie Peloquin, Global Advanced Product Support Manager
Olympus Scientific Solutions Americas (OSSA)
Emilie Peloquin has been in the welding/NDT industry since 2009. She holds an associate degree in Applied Science and is trained in accordance to SNT-TC-1A for Level II on UT, ET, RT, MT, PT, and VT. Emilie joined Olympus in 2014 and has held positions ranging from technical support to product management, focusing on ultrasonic, phased array, and other advanced inspection technologies. As a Global Advanced Product Support Manager, she and her team are involved in business and product development, supporting a variety of applications across numerous industries.

Webinar: Acoustic Influence Map (AIM)—The Modeling Tool for Your TFM Inspection