Advanced Analysis Tools

The GX53 microscope’s various observation capabilities provide clear, sharp images, so you can reliably detect defects in your samples. PRECiV image analysis software's new illumination techniques and image acquisition options give you more choices for evaluating your samples and documenting your findings.

Combined high numerical aperture and long working distance

Objective lenses are crucial to a microscope’s performance. The new MXPLFLN objectives add depth to the MPLFLN series for epi-illumination imaging by maximizing numerical aperture and working distance at the same time. Higher resolutions at 20X and 50X magnifications typically mean shorter working distances, which forces the sample or objective to be retracted during objective exchange. In many cases, the MXPLFLN series’ 3 mm working distance eliminates this problem, enabling faster inspections with less chance of the objective hitting the sample.

Learn More about MXPLFLN Objectives>>

The Invisible Becomes Visible: MIX Technology

MIX technology combines darkfield with another observation method, such as brightfield or polarization, to enable you to view samples that are difficult to see with conventional microscopes. The circular LED illuminator has a directional darkfield function where one or more quadrants are illuminated at a given time, reducing a sample’s halation to better visualize surface texture.

Cross-section of a printed circuit board

Stainless steel

Easily Create Panoramic Images: Instant MIA

With multiple image alignment (MIA), you can stitch images together simply by moving the XY knobs on the manual stage—a motorized stage is optional. PRECiV software uses pattern recognition to generate a panoramic image, making it ideal for inspecting carburizing and metal flow conditions.

Metal flow of a bolt

Create All-in-Focus Images: EFI

PRECiV software’s extended focus imaging (EFI) function captures images of samples whose height extends beyond the depth of focus. EFI stacks these images together to create a single all-in-focus image of the sample. Even when analyzing a cross-section sample with an uneven surface, EFI creates fully-focused images.

EFI works with either a manual or motorized Z-axis and creates a height map to visualize structures.

Resin parts

Capture Both Bright and Dark Areas Using HDR

Using advanced image processing, high dynamic range (HDR) adjusts for differences in brightness within an image to reduce glare. It also helps boost the contrast in low-contrast images. HDR can be used to observe minute structures in electric devices and identify metallic grain boundaries.

Gold plate

Chromium diffusion coating

Applications

There are just a few examples of what can be achieved using different observation methods.

PRECiV Software – Optimized for Materials Science

Together, the GX53 microscope and PRECiV software support metallurgical analysis methods that comply with different industrial standards. With step-by-step operator guidance, users can analyze their samples quickly and easily.

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Particle Analysis – Count and Measure Solution

The Count and Measure solution uses advanced threshold methods to reliably separate objects, such as particles and scratches, from the background. More than 50 different object measurement and classification parameters are available including shape, size, position, and pixel properties.

Grain classification results

Grain Sizing in a Microstructure

Measure the grain size and analyze the microstructure of aluminum, steel crystal structures, such as ferrite and austenite, and other metals.
Supported standards: ISO, GOST, ASTM, DIN, JIS, GB/T

Microstructure of ferritic grains

Evaluating Graphite Nodularity

Evaluate the graphite nodularity and content in cast iron samples (nodular and vermicular). Classify the form, distribution, and size of graphite nodes.
Supported standards: ISO, NF, ASTM, KS, JIS, GB/T

Ductile cast iron showing nodular graphite

Cast iron solution

Rating Nonmetallic Inclusion Content in High-Purity Steel

Classify nonmetallic inclusions using an image of the worst field or worst inclusion found manually in the sample.
Supported standards: ISO, EN, ASTM, DIN, JIS, GB/T, UNI

Steel with nonmetallic inclusions

Inclusion worst field solution

Compare Images of Your Sample and Reference Images

Easily compare live or still images with auto-scaled reference images. This solution includes reference images in accordance with various standards (additional reference images can be purchased separately). Multiple modes are supported, including live overlay display and side-by-side comparison.
Supported standards: ISO, EN, ASTM, DIN, SEP

Simple and Efficient Inspections

Use the GX53 microscope and PRECiV software to acquire images of diverse samples, conduct a variety of analyses, and generate professional reports.

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Easily Restore Microscope Settings: Coded Hardware

Coded functions integrate the microscope’s hardware settings with PRECiV image analysis software. The observation method, illumination intensity, and magnification can be recorded and stored with the associated images. The settings are easily reproduced so that different operators can conduct the same quality inspections with limited training.

User Guidance Helps Simplify Advanced Analysis

The software guides users step-by-step through an inspection process that complies with the chosen industrial standard. Operators can conduct advanced analysis simply by following the on-screen guidance.

Efficient Report Generation

Creating a report can often take longer than capturing the image and taking the measurements. PRECiV software provides intuitive report creation to repeatedly produce sophisticated reports based on predefined templates.