Recent News | Olympus IMS

04 Dec	Olympus Introduces The Magna-Mike 8600 Advanced Hall Effect Thickness Gage
30 Nov	Olympus Announces Patent Filing of New Method to Measure Lead (Pb) in a Multilayer Coating with Tube-Based Handheld XRF
16 Nov	Olympus NDT Introduces New TOFD Capabilities for the OmniScan MX2 Flaw Detector.
01 Nov	Olympus Introduces InHelp™, the New Data Management and Reporting Software for Industrial Videoscopes
01 Nov	Olympus Adds New Options to DSX Series of Opto-digital Microscopes
01 Nov	Olympus Announces 50kV DELTA DP-4050 Handheld XRF Analyzer Compliance with RED Act
26 Oct	Olympus Releases New, Advanced Software for DELTA Handheld XRF Analyzers
24 Oct	Olympus NDT Introduces New Phased Array and Ultrasound Modules, NDT SetupBuilder, and OmniPC software to expand the Capabilities of the OmniScan MX2 Flaw Detector.
01 Oct	Olympus Introduces the 45MG Advanced Ultrasonic Thickness Gage
19 Sep	Olympus GoldXpert Highlighted at Hong Kong Jewelry & Gem Fair
02 Jul	Olympus Introduces the IPLEX TX, the First Articulating Videoscope to Feature a 2.4 mm Diameter Insertion Tube
01 Jun	Olympus Introduces a Fast Way to Identify the Purity and Fineness of Gold and Precious Metals
24 Apr	Olympus NDT is pleased to introduce the computer-based OmniPC software for the OmniScan phased array flaw detector.
17 Jan	OLYMPUS Launches DSX Opto-Digital Microscope Series

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