Overview

OmniScan™ X4 Phased Array Flaw Detector with TFM and PCI

Detect and Define Smaller HTHA Cracks

Detecting HTHA early and reliably is so challenging that multiple inspection methods are often used in conjunction to maximize the probability of detection. Time-of-flight diffraction (TOFD), along with focused phased array (PA) and the total focusing method (TFM), especially using Dual Linear Array™ (DLA) probes, have shown to be particularly effective inspection techniques for this application.

OmniScan™ X4 flaw detector fully supports these methods, as well as innovative phase coherence imaging (PCI), which enhances small flaws and crack tips. OmniScan X4 instruments also offer a variety of onboard software tools to ease your setup and analysis workflow.

Integrated DLA probe configuration and scanner configuration
High-resolution TFM images (up to 1024 × 1024 points)
Software tools to optimize the TFM inspection process, from setup to analysis (scan plan with AIM model, automatic TCG, sparse firing, soft gain and palette slider, live TFM envelope and image filters, gates, and alarms)
64-element TFM aperture and 128-element extended TFM aperture (OmniScan X4 64:128PR model)
Phase coherence imaging to enhance small defects and crack tips (all OmniScan X4 units)
Acquire up to 8 TOFD and phased array groups simultaneously for efficient screening
Acquire and display up to 4 TFM and PCI groups at once
Plane wave imaging (PWI) available with TFM and PCI (using the OmniScan X4 unit with linear array probes)

Probes

High-Sensitivity Probes for HTHA

Earlier and More Reliable Detection of High-Temperature Hydrogen Attack

Maximize Your Angle-Beam Coverage of the Weld and Heat-Affected Zone

A38 and A28 Dual Linear Array™ Angle-Beam Probes

High-sensitivity 10 MHz dual arrays in pitch-catch configuration
Small element pitch enables clear TFM imaging and wide-angle coverage of the weld and heat-affected zone (HAZ)
Patented pivoting housing allows closer positioning of the arrays, extending the probe’s through-thickness coverage
Dedicated wedge series covering pipe diameters from 4 to 48 in. OD and thicknesses up to 95 mm (3.74 in.)
64-element arrays of the A38 DLA enable sharper and deeper focusing, unlocking the full potential of the OmniScan™ X4 flaw detector
32-element arrays of the A28 DLA offer a smaller wedge footprint for easy access and coupling near the weld

Fast Scanning of Parent Materials for Reliable Detection of HTHA Zero-Degree REX1 Dual Linear Array Probe 10 MHz dual 64-element arrays Beam width coverage up to 30 mm (1.18 in.) Adjustable stabilization and carbide wear protection system fits to the surfaces of pipes as small as 4 inches (101.6 mm) OD Integrated wedges covering thicknesses from 4 mm to 95 mm (0.16 in. to 3.74 in.) Provides clear C-scan images when used with an encoder or scanner

Fast Scanning of Parent Materials for Reliable Detection of HTHA

Zero-Degree REX1 Dual Linear Array Probe

10 MHz dual 64-element arrays
Beam width coverage up to 30 mm (1.18 in.)
Adjustable stabilization and carbide wear protection system fits to the surfaces of pipes as small as 4 inches (101.6 mm) OD
Integrated wedges covering thicknesses from 4 mm to 95 mm (0.16 in. to 3.74 in.)
Provides clear C-scan images when used with an encoder or scanner

Leverage Multiple Inspection Methods for Reliable HTHA Detection

A31 and A32 Pulse-Echo Probes Optimized for HTHA

Offering high definition, these 10 MHz 64-element linear probes are optimized for efficient TFM and PWI inspections
Smaller element pitch of the A31 probe enables wide-angle coverage of the weld and HAZ
Wider total aperture of the A32 probe enables finer resolution and deeper focusing

Specifications

Part Number/Description	Item Number	Frequency (MHz)	Element Configuration	No. of Elements	Pitch (mm)	Active Aperture (mm)	Elevation (mm)	Roof Angle (deg)	Thickness Range (mm)
10DL32-9.6X5-A28 (FD25 wedge)	Q3301742	10	Dual 32	64	0.3	9.6	5	Set by wedge	4–45
10DL32-9.6X5-A28 (FD60 wedge)	Q3301742	10	Dual 32	64	0.3	9.6	5	Set by wedge	45–95
10DL32-19.2X5-A38 (FD25 wedge)	Q3302412	10	Dual 64	128	0.3	19.2	5	Set by wedge	4–45
10DL32-19.2X5-A38 (FD60 wedge)	Q3302412	10	Dual 64	128	0.3	19.2	5	Set by wedge	45–95
10DL64-32X5-1DEG-REX1-PR	Q3301737	10	Dual 64	128	0.5	32	5	1	30–95
10DL64-32X5-5DEG-REX1-PR	Q3301733	10	Dual 64	128	0.5	32	5	5	4–30
10L64-19.84X10-A31	Q3301607	10	Linear	64	0.31	19.84	10	N/A	3–90
10L64-32X10-A32	Q3300429	10	Linear	64	0.5	32	10	N/A	8–110
Although all Dual Linear Array probes are manufactured with 10 MHz piezo-composite, the tested center frequency specification of the REX1 models shifts down to ~9.0 MHz because of attenuation occurring in the integrated wedge. These probes come standard with an OmniScan™ connector and a 2.5 m (8.2 ft) cable or can be specially fitted with other connectors and cable lengths. Important note: Using phased array probes in direct contact with a surface during inspection can lead to permanent damage. A wedge should always be used.

Wedges for A38 and A28 Probes

The A38 and A28 DLA probes’ dedicated angle-beam wedge series are optimized for weld volume and heat-affected zone inspection. The angle of these wedges is set to generate L-waves at a 65-degree nominal incident angle in steel. They feature a roof angle calculated for each AOD diameter from 4 in. to 48 in. (101.6 mm to 1220 mm).

SA38 and SA28 wedges are available in two focus depths (FD) to cover a wide range of thicknesses, from 4 mm to 95 mm (0.16 in. to 3.74 in.). These wedges enable you to fully exploit the A38 probe’s extended focusing capabilities.