Phased array ultrasonic testing (PAUT) has become a cornerstone in nondestructive testing (NDT), helping industries ensure safety, reliability, and quality. We are now opening the door to more sophisticated inspection techniques thanks to the new OmniScan™ X4 128:128PR* phased array flaw detector. This innovation gives inspection professionals access to a new level of power, precision, and flexibility—without sacrificing portability or ruggedness.
*Patent Pending
Advancing PAUT Performance Beyond 64 Elements
The integration of 128-element pulsers opens the door to inspection applications that were previously out of reach for portable PAUT systems. By doubling the number of available pulsers, users can expand their inspection capabilities, develop new methods, and apply PAUT in areas previously considered impractical with portable equipment.
Power and Portability—Together at Last
Traditionally, instruments with 128:128PR performance were large and not designed for field use. Now, inspectors can access all the power of a 128:128PR instrument in a device that remains compact, rugged, and truly portable. This breakthrough provides field-ready performance without compromise, ensuring that advanced applications can be executed on-site just as effectively as in a controlled lab environment.
Flexible Upgrade Paths to 128:128PR
Organizations looking to extend their PAUT capabilities can now do so without committing to an entirely new system. The 128-element solution allows customers to upgrade their existing OmniScan X4 64:128PR instruments to a full 128:128PR configuration. For those who prefer to expand their fleet, a new 128:128PR model is also available. This flexibility ensures that users can adopt the latest technology at a pace and investment level that aligns with their operational needs.
Enhanced Focalization and Steering
Beyond raw pulser count, the move to 128 elements significantly improves inspection performance. The technology enhances focalization for thick materials and enables more precise off-axis beam steering. It also maintains strong sensitivity even at higher steering angles, allowing inspectors to achieve sharper focusing, greater coverage, and more reliable results in complex applications such as thick weld inspections.
Going Beyond 64 Elements for Linear and Matrix Probes
The addition of 128-element pulsers unlocks the use of larger linear probes. With a wider aperture available, inspectors can employ bigger probes and gain improved flexibility for both sectorial and linear scans. This advancement enhances coverage and efficiency, making it easier to complete demanding inspections in less time.
Conclusion
The integration of 128-element pulsers into a portable, rugged PAUT instrument represents a significant step forward in nondestructive testing. It not only empowers technicians with greater inspection capabilities but also provides flexible upgrade paths, ensuring that investments remain cost-effective.
For industries where precision, portability, and reliability are critical, this technology sets a new standard—delivering advanced PAUT applications in the field without compromise.
