These operative microscope capabilities also enable submicron measurements of a sample's surface and measurement of micro-roughness on an uneven surface. A precise 0.8 nanometer resolution linear scale and software algorithms, such as our original I-Z curve, can resolve height differences of 10 nanometers.

The OLS4100 opto-digital microscope employs a dual confocal system, incorporating two confocal optical light paths. In combination with a high sensitivity detector for precise 3D microscope images from a sample consisting of materials with different reflectance characteristics.  (More on reflectance, measuring transparent samples and other imaging capabilities of the OLS4100 professional microscope in our gallery)

Multi-Layer Mode
The LEXT OLS4100's new multilayer mode is capable of recognizing the peaks of reflected light intensities originating from multiple layers. Setting each layer as the focal point makes it possible to observe and measure the upper surface of a transparent sample. This also enables the analysis of multiple layers, measuring the thickness of each layer.

Observation/Measurement of Multiple Layers of Transparent Material
The multi-layer mode facilitates observation and measurement of the transparent layer on the surface of a transparent sample. Even with a transparent resin layer on a glass substrate, the shape and roughness of each layer as well as the thickness of the surface film can be measured.

The performance of a measuring tool is typically expressed using two different terms: "accuracy," which indicates how close a measurement value is to its true value, and "repeatability," which indicates the degree of variations among repeated measurement values. The OLS4100 is the industry's first laser scanning compound microscope to assure both accuracy and repeatability.

The OLS4100 uses a rigorous system of production for every component. From the objective lens to the laser head, Olympus delivers only the highest-quality systems based on comprehensive inspection to the strictest standards. On delivery, final adjustment and calibration is performed by qualified engineers in the actual measurement environment.

Step Measurement

This mode allows measurement of a step between any two arbitrary points on a surface profile. Profile Measurement is also available.

Surface Roughness Measurement

This mode allows measurement of line roughness on one line and plane roughness on the entire surface.

Area/Volume Measurement

With a user-defined threshold level on a surface profile, this mode allows measurement of the volume (or area) of a geometry above or below the threshold level.

Particle Measurement (optional)

This mode enables auto-separation of particles with the separator function, setting of a threshold level, and setting of a detection range within a region of interest.

Geometric Measurement

This mode allows measurement of the distance between two arbitrary points on a geometric image. The geometric shape and angle for circle, rectangle, etc. are measured.

Film Thickness Measurement (optional)

This mode allows the thickness of a film on a transparent body to be measured by detecting changes in refractive index.

Auto Edge Detection/ Measurement (optional)

This mode allows a line width or a diameter to be measured by automatically detecting edges in a geometric image. This reduces uncertainty by eliminating operator error.

Contact surface roughness gages cannot measure micro surface contours less than the stylus tip diameter. The OLS4100 professional microscope can measure the surface roughness of micro geometries at high resolution due to a diminutive laser spot diameter.

Polymer Film 3D image

Bonding Wires

Surface roughness gauges cannot measure micron-level features since their styli are not able to access these areas. The OLS4100 can correctly identify a measuring position and easily perform roughness measurement of a target micro area.

Thanks to a white LED light and a high-color-fidelity CCD camera in the OLS4100 industrial microscope, you can generate clear, natural-looking color images, comparable to those obtained with high-grade optical microscopes.

Realistic Surface Reproduction, Laser DIC (Differential Interference Contrast) Differential Interference Contrast (DIC) is an observation method used to visualize nanometer micro surface contours, which normally lie far beyond the resolving power of a laser microscope. This DIC laser mode in the OLS4100 industrial microscope allows you to obtain live images comparable to those of an electron microscope under relatively low power magnifications.

In addition to the previous capabilities, the OLS4100's High Dynamic Range (HDR) function combines several optical microscope images captured using different exposures. Brightness, contrast, texture and saturation are controlled individually for HDR to create images with a wide dynamic range. This enables clear visualization of a color image, especially for samples lacking texture.

Algorithm

To eliminate external influences on measurement and imaging, the OLS4100 incorporates a hybrid vibration dampening mechanism using coil springs and dampening rubber to stabilize the operating environment. This eliminates the need for a dedicated vibration-dampening stand, allowing measurements on any desktop.

Once you receive your OLS4100, you can begin observation or measurement immediately once the sample is placed on the stage. Our easy three-step “Imaging, Measurement and Reports” process set-up means that measurement procedures can be quickly mastered, even by those not familiar with industrial laser microscopy, simply by selecting the operating mode suitable for the operator’s experience level.

Two stitching methods are available for scanning large areas: Manual mode for live image acquisition and Automatic mode for faster image acquisition. Operation is quick and simple—2D stitching starts automatically at the touch of a single button, and wide area images are acquired immediately. The stitching size is available from five steps in 3x3, 5x5, 7x7, 9x9, and 21x21 in Automatic mode. Unnecessary parts of the acquired images can also be removed manually with simple mouse/joystick operation.

The OLS4100 also comes with a Band Scan mode for measurement of limited target areas, providing measurement performance 1/8th faster than conventional modes.

Stitching Area: Square (21x3) 63 Pieces

Stitching Area: Circle (3 Points)

In Live mode, the area to be observed can be selected manually by tracing the required region onscreen. This is ideal when the sample has an irregular shape.

In Smart Scan mode, all it takes is the click of a button. As the location across the Z-axis is automatically adjusted, image acquisition in the Z-axis direction can be restricted to required areas only, for rapid high-power observation across a wide area.

The OLS4100 professional microscope generates customizable reports at the touch of a button after measurement, and an edit function allows the operator to customize each report template, too. Copying and pasting measured results into a document or spreadsheet is also quite simple, as is retrieving required images or reports from a database.

A detailed user-designed wizard function eliminates the need for lengthy training and allows quick and easy operation by new operators.