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Industrial Microscopes
Fast Analysis

Live analytics of metallic and non-metallic particles

Fast Live Analytics and Reviews

With an innovative polarization method, CIX100 delivers image acquisition and precise live analytics of both reflective (metallic) and non-reflective (non-metallic) particles, ranging from 2.5 µm up to 42 mm, all in a single scan.

Counted and sorted particles are displayed live and sorted into size classes during the scan, supporting fast decisions in case of a failed test.

All-in-One Scan for High Throughput

The innovative polarization method based on wavelength separation and color detects both reflective (metallic) and non-reflective (non-metallic) particles in a single scan, offering multiple benefits for high-throughput labs:

  • Detects reflective and non-reflective particles twice as fast as conventional methods that require two separate images
  • Eliminates moving components from the optical light path, such as the polarizer, which could impact the system stability and lead to incorrect results
  • Increases the number of inspected particles, reducing the cost per test
The CIX100’s illumination system separates reflective (metallic) and non-reflective (nonmetallic) particles in a single scan.

The innovative illumination system separates reflective (metallic) and non-reflective (non-metallic) particles in a single scan.

Review Particles in Real Color

Activate real color mode to view particles in their actual colors, providing more information to identify the particle type as metallic or non-metallic.

The all-in-one scan shows all reflective particles as blue in polarization, indicating they’re metallic. In real color mode, the blue color of reflective particles is omitted, revealing the true colors of all particles in the brightfield image. Materials that are actually blue remain blue, while metals show their metallic shine and the reflections typical for the material.

These helpful visuals help you better understand the nature of each particle and quickly confirm the particle type.

Left: Particle as seen by the CIX100 system during detection and analysis. Right: The same particle as seen in real color.

Particle as seen by the system during detection and analysis. The blue color indicates that this particle is metallic. The same particle as seen during the review mode in real color using the U-ANT filter and the color correction mode. The particle is confirmed as metallic.

Large particles are automatically combined and analyzed.

Large particles are automatically combined and analyzed.

Intelligent Handling of Particles

The CIX100 offers live processing and classification of both small and large particles (2.5 μm up to 42 mm) according to international standards and automatically reconstructs images of large particles. Dark particles on a bright background and vice versa can be analyzed.

Identification of Filter Coverage

The sample overview image is created at the start of the sample inspection and displays the entire filter at low magnification, enabling the identification of filter coverage or particle clusters before the inspection begins. The system automatically informs users if the filter assignment is higher than desired so they can react quickly.

The overview image identifies filter occupancy and particle clusters.

The overview image identifies filter occupancy and particle clusters.

Direct result feedback on the CIX100 inspection system

Direct Result Feedback

Contaminants are automatically analyzed and sorted into size classes defined by the selected standard, then color coded to indicate any class exceeding a preset limit. Acceptable particle counts per size class are displayed, enabling early sample validation (OK) or rejection (NOK), even before the entire membrane is scanned.

As required by the electric mobility and medical device industries, PRECiV CIX software lets you evaluate the approval limits for individual particle types. An acoustic signal can be switched on to notify users when the approval reads NOK or the inspection is complete.

Analysis Beyond Classical Algorithms

With integrated TruAI deep-learning technology, the CIX100 can analyze images beyond classical algorithms. Apply a trained neural network to your samples for a more reproducible and robust analysis. The TruAI solution enables you to distinguish between different particle types, such as reflecting and non-reflecting.

TruAI solution on the CIX100 inspection system
Intuitive tools to revise cleanliness inspection data on the CIX100 system

Data Insights for Faster Decisions

The CIX100 combines intuitive tools to revise inspection data with a fast, guided particle review. One-click reclassification ensures flexibility and supports international standards. Thumbnail images of detected contaminants link directly to dimensional measurements for easy data review.

Contaminant results update automatically across all views and size classes during the review process. This saves time with clear representations of all relevant inspection results.

Trend Analysis

Data statistical analysis can be performed over time and graphically displayed.

Trend analysis on the CIX100 inspection system
Inspection data at a glance on the CIX100 inspection system

Inspection Data at a Glance

  • Clear arrangement of images, data, and results for immediate decisions on reprocessing
  • At-a-glance display of inspection data in various selectable views
  • Images of particles are organized from largest to smallest for all types of particles (reflective or non-reflective)

Review, Revise, and Recalculate

A manual check and review of the results is generally recommended in technical cleanliness inspection, and the interface makes interactive correction of the particle data quick and easy.

Interactive correction of the particle data on the CIX100 inspection system
Height measurement solution on the CIX100 technical cleanliness inspection system

Height Measurement Solution

The CIX100 offers an extended focus imaging (EFI) function that captures images of contaminants and particles whose height extends beyond the objective’s depth of focus and stacks them together to create an all-in-focus image.

Further enhance the CIX100 with our height measurement solution, comprised of a 20X objective* and special software, to fulfill the VDA 19 requirements for height measurements. For selected particles, the measurement is performed either automatically or manually. The calculated value is listed as an additional data field in the results sheet.

*Must be ordered separately from the height measurement solution license.

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