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Overview

Vanta™ iX In-Line XRF Analyzer for Automated Material Analysis

Keep Your Process Up to Speed

The Olympus Vanta™ iX in-line X-ray fluorescence (XRF) analyzer gives you confidence in your products by automating material analysis and alloy identification on the manufacturing line:

Delivers instant results for real-time process monitoring and 100% inspection
Built to operate 24/7
Configured to deliver pass/fail results, accurate grade ID, and material chemistry

100% Inspection for Metal Fabrication of Tubes, Bars, and Rods

For organizations adopting Industry 4.0 practices and 24/7 process control to verify alloys with pass/fail analysis, the Vanta iX analyzer delivers material verification and lot/heat control for bar, billet, tube, and rod manufacturing, as well as machined parts and customized components. Automating your testing with a Vanta iX analyzer adds a competitive edge to your finished product since you can demonstrate that materials are 100% tested and verified.

Scanning and Monitoring for Ore Grade Control in Mining

For geological processing and mining, the Vanta iX analyzer enables core scanning and on-belt analysis with real-time results to monitor process variability and ensure ore grade consistency. During on-belt analysis, the analyzer provides blending verification and process validation of concentrates.

x-ray fluorescence spectroscopy for metal fabrication

alloy and metal testing for manufacturing QA/QC

Fast and Accurate Elemental Analysis for Continuous Quality Control

Like all Vanta electronics, the Vanta iX analyzer works fast while delivering reliable, actionable results to guide critical decisions.

High resolution: ID a range of alloy grades—including light and heavy elements
Fast, accurate results: the analyzer’s electronics provide high throughput, stability, and count rate
Efficient: features a silicon drift detector (SDD) and the proven Axon Technology™ found in every Vanta analyzer

Easily Integrates into a Variety of Production Systems

The Vanta iX analyzer is versatile, compact, and easy to install—use the mounting holes on each side to mount the analyzer onto robotics and other systems. There is no external control box, so you can easily control the analyzer with either the Vanta Connect API or a PLC and discrete wire.

Connector options:

Ethernet (RJ-45), enabling Power over Ethernet
USB
Discrete I/O (16 pins)
AUX DC power

inline XRF analyzer for automated material analysis

Rugged for Greater Uptime in Manufacturing Environments

The Vanta iX analyzer is built to endure the high levels of vibration, electromagnetic and acoustical noise, dust, and moisture of production facilities for increased reliability and uptime.

Vibration tested (MIL-STD)
IP54 rated
Designed to operate from –10 °C to 50 °C (14 °F to 122 °F) with continuous testing

A built-in heat sink lowers the internal temperature, while fan attachment points are available if additional cooling is needed. The analyzer offers toolless window changes for fast maintenance.

Specifications

Vanta™ iX Specifications

Dimensions (W × H × D)	10 cm × 7.9 cm × 26.6 cm (3.9 in. × 3.1 in. × 10.5 in.)
Weight	2.4 kg (5.29 lb)
Excitation Source	X-ray tube: Rh or W anode (application optimized) 5–200 μA MR model: 8–50 keV (4 W max) CW model: 8–40 keV (4 W max)
Primary Beam Filtration	Eight filter positions automatically selected per beam per method
Detector	MR model: Large-area silicon drift detector CW model: Standard silicon drift detector
Power	Power over Ethernet (PoE) or 18 V AC power adaptor
Elemental Range	Method dependent: MR model: Mg–U CW model: Ti–U (with standard window and calibration)
Pressure Correction	Built-in barometer for automatic altitude and air pressure correction
IP Rating	IP54
Operating Environment	Temperature range: –10 °C to 50 °C (14 °F to 122 °F) under continuous duty cycle Humidity: 10% to 90% relative humidity, non-condensing
Operating System	Linux
Application Software	Olympus proprietary data acquisition and processing package