偏振光观察

It is a microscopic observation technique with polarized light generated by a set of two filters (analyzer and polarizer). The polarization axes are perpendicular to each other for extinct. Some specimens located between the two filters give characteristic contrast or coloration according to each birefringence property and orientation (i.e. A polished specimen of zinc structure). Polarizer is located in the light path before the vertical illumination, while analyzer is inserted in the observation path before eyepiece. Suitable for metallurgical structures (i.e. growth pattern of the graphite on nodular casting iron), minerals and liquid crystal (LCD) and semiconductor materials.

Silicon Wafer

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