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Industrial Microscopes
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Customize Your Software Package

Developed for our microscopes, Stream Enterprise data management software is a powerful and user-friendly measurement tool. There is no need to manually record the optical parameters of UIS2 objectives when using it with a conventional microscope. Magnification calibration is also not required when importing images from our DSX and LEXT microscopes. The software is available from entry-level to advanced packages.


OLYMPUS Stream Packages 

OLYMPUS Stream software is available in four packages based on functionality—Start, Basic, Essentials, and Motion.
Application-specific materials solution modules can be added to streamline repetitive analysis tasks. Olympus representatives can help you determine which package is right for you. 

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Seamlessly Integrates with Most Evident Optical Microscopes 

Control Upright Microscopes

BX53M microscope and software system

BX53M microscope and software system 

The BX53M microscope employs coded functions that integrate the microscope’s hardware settings with Stream Enterprise data management software. The observation method, illumination intensity, and objective position are all recorded by the software and/or the handset. The microscope settings can be automatically saved with each image, making it easier to reproduce the settings at a later time and provide documentation for reporting purposes.

View our upright microscopes


Control Inverted Microscopes

GX53 microscope and software system

GX53 microscope and software system

Our digital cameras provide high-resolution viewing and fast image transfer while our software provides all the tools needed for today's complex metallurgical requirements. 
Choose from extended measurements, standard metallography, and advanced metallography application-specific modules (over a dozen application specific routines are available), and automatically populate data and create reports that comply with common ASTM and ISO specifications. 

View our inverted microscopes


Control Semiconductor Microscopes

Integrated microscope and software system

Integrated microscope and software system

We offer several software platforms that integrate with our semiconductor microscope frames to control all motorized functions, including the digital camera and motorized stage. Each interface is designed for basic inspection and control, advanced image analysis, or repetitive site inspection and defect review.

View our semiconductor microscopes


Control Stereo Microscopes

SZX16 microscope and software system

SZX16 microscope and software system

Our stereo microscope motorized focus drive makes digital documentation with extended focal imaging (EFI) efficient and fully automatic. This even enables the creation of pseudo 3D images. The software offers tools for simple 2D measurements up to complex phase analysis and support many operations including observation, report generation, database creation, and archiving.

View our stereo microscopes


Enhance the Power of Evident Confocal and Digital Microscopes

Use Stream Enterprise Data management software for post-processing (Stream Enterprise Desktop) with the complete range of DSX series digital microscopes and the LEXT 3D measuring laser microscope.

LEXT 3D measuring laser microscope

LEXT 3D measuring laser microscope

DSX digital microscope series

DSX digital microscope series

View the LEXT 3D Measuring Laser Microscope
View the DSX Digital Microscope


Supports Most Evident Digital Cameras

Resolution and Color Fidelity

The low-noise, high-resolution images of a 9-megapixel sensor enable the user to zoom deep into the sample, revealing its structures (sandstone)

The low-noise, high-resolution images of a 9-megapixel sensor enable the user to zoom deep into the sample, revealing its structures (sandstone)

Excellent spatial resolution combined with a high pixel count exploit the full optical resolution of the objectives and enable the structures and details within the smallest samples to be imaged, even with low magnification objectives. High-resolution images enable you to make observations exclusively on screen without using the eyepieces.

Reveal More with Infrared (IR)

Brightfield image 5x taken with the DP23M monochrome camera, a. Brightfield image 5x b.) IR image 5x (BP1100 nm filter), c.) Cropped detail 20x IR, d.) Cropped detail 20x IR with DCE filtering

Brightfield image 5x taken with the DP23M monochrome camera,
a. Brightfield image 5x
b.) IR image 5x (BP1100 nm filter),
c.) Cropped detail 20x IR,
d.) Cropped detail 20x IR with DCE filtering

IR imaging mode is a fundamental tool for quality control and R&D laboratories. IR mode enables nondestructive inspection through silicon layers of packaged products during the backend stage of fabrication.

View our digital cameras


Dedicated Observation Methods for Materials Science

HDR imaging for enhanced contrast

High dynamic range (HDR) imaging improves image contrast in difficult conditions (very bright areas together with very dark areas in the same image). All cameras supported by Stream Enterprise data management software can be used in this mode, and dedicated cameras have an available live mode.

Clearly exposed for both dark and bright parts by HDR (Sample: fuel injector bulb)

Clearly exposed for both dark and bright parts by HDR (Sample: fuel injector bulb)

Contrast enhancement by HDR (Sample: Sliced magnesite)

Contrast enhancement by HDR (Sample: Sliced magnesite)


MIX observation to visualize sample’s surface structure

The software supports our MIX observation

This illumination technique combines directional darkfield, which uses a circular LED to illuminate one or more quadrants at a given time, , and brightfield, fluorescence, or polarization, enabling you to highlight defects and differentiate raised surfaces from depressions that are normally difficult to see with conventional microscopes. MIX observation helps reduce a sample’s halation and is useful for visualizing a sample’s surface texture.

Conventional: brightfield shines the light straight down on the sample while traditional darkfield highlights scratches and imperfections on a flat surface by illuminating the sample from the side of the objective

Conventional: brightfield shines the light straight down on the sample while traditional darkfield highlights scratches and imperfections on a flat surface by illuminating the sample from the side of the objective

Advanced: MIX is a combination of brightfield and directional darkfield from a ring of LEDs; the LEDs can be adjusted to select which direction to illuminate from

Conventional: brightfield shines the light straight down on the sample while traditional darkfield highlights scratches and imperfections on a flat surface by illuminating the sample from the side of the objective

Advanced: MIX is a combination of brightfield
and directional darkfield from a ring of LEDs;
the LEDs can be adjusted to select which
direction to illuminate from

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