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Olympus IMS Webinars Archive

Welcome to Olympus IMS library - Join us for prerecorded and live webinars to discuss trending topics. Missed a webinar? No problem, you can listen again. Don’t see a topic you’d like to discuss? Use our feedback form or contact our experts directly for help.

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API 578 101: Standards, Guidelines, and Recommended Practices for PMI

In this webinar, Wayne Vereb, of Metal Analysis Group in Houston, TX, and Peter Faulkner, Olympus, will discuss topics related to the upcoming training for the American Petroleum Institute recommended practice 578...
 

Automated Surface Inspection Using Eddy Current Array Technology

Bar Inspection System (BIS-ECA) Eddy Current Array Technology Systems & Integration Group

 

Roughness in a Nutshell

专家
战略营销高级经理
Markus Fabich, Strategic Marketing Manager Industrial Equipment EMEA
Many factors can impact the quality of videoscope images...
 

便携式X射线衍射(pXRD)和X射线荧光(pXRF)在贱金属和金矿勘探中的创新应用

专家
奥林巴斯国际矿业总监
澳大利亚地球科学理事会主席
In this webinar Professor David Cohen (President of the Academic Board of University of New South Wales and President of Australian Geoscience Council) will present examples of pXRF and pXRD used in various gold and base metal exploration projects...
 
WeldSight Software

Introduction to WeldSight Software: Part 2 - Analysis

Advanced phased array (PA) weld inspection often requires operators to navigate complex software that is time-consuming and difficult to learn...
 

Ensuring Code Compliance While Using the Total Focusing Method

专家
Global Markets Director, Fuel and Energy
Olympus Scientific Solutions Americas (OSSA)
Learn about the current codes and standards that apply to FMC and TFM and understand the reasons behind these new requirements...
 
Olympus OmniScan X3 Phased Array Flaw Detector

Total Focusing Method (TFM) vs Phased Array (PAUT)—When to Use Each Method

专家
Global Advanced Product Support Specialist
Know when to choose TFM over PAUT, and vice versa...
 

Zaawansowane techniki obserwacji od makro do mikro. Mikroskopy optyczno cyfrowe i laserowe firmy OLYMPUS

W badaniach mikroskopowych spotykamy się z próbkami o różnych rozmiarach, różnej topografii i różnym stopniu skomplikowania. Czasami poszukujemy defektów, czasami zanieczyszczeń, a czasami niezgodności wymiarowej w stosunku do założonej specyfikacji. Badania mikroskopowe wymagają różnego sposobu obserwacji (różne powiększenia, różny kąt obserwacji, różny rodzaj światła) oraz różnych technik obserwacji (np. jasne pole, ciemne pole, polaryzacja itp.). Mamy na to wszystko jedno rozwiązanie...

 
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