NDT Solutions
- Flaw Detectors / Phased Array Flaw Detectors
- Thickness Gauges
- Transducers and Probes
- Single and Dual Element Transducers
- Angle Beam
- Atlas European Standard
- AWS Wedges & Transducers
- CDS Wedges
- Contact
- Delay Line
- Dual Element
- EMAT
- High-Frequency
- Immersion Transducers
- Immersion Special
- Immersion Accessories
- Integral Angle Beam
- Normal Incidence Shear Wave
- Protected Face
- RTD
- Special Applications
- Spot Weld
- Standard Angle Beam
- TOFD
- Test Blocks
- Transducer Cables
- Couplant & Adaptors
- Eddy Current Probes
- Probes for Tube Inspection
- Phased Array Probes
- EdgeFORM
- Weld Series
- Dual Array Probes for Welds
- Dual Array Probes for Corrosion
- Flexible Phased Array Probe
- Manual Contact Probes
- Small-Footprint Probes
- Universal Probes
- Near-Wall Probes
- Deep Penetration Probes
- Immersion Probes
- Curved Array Probes
- Immersion Corner Wedges for Curved Array Probes
- Integrated Wedge and Code Compliant Probes
- Wedges
- HTHA Probe
- RexoFORM Wedge
- BondMaster Probes
- Single and Dual Element Transducers
- Automated Inspection Systems
- NDT Systems Instrumentation
- NDT Industrial Scanners
- Evident Connect
- Software
Industrial Microscopes
- Laser Confocal Microscopes
- Digital Microscopes
- Measuring Microscopes
- Cleanliness Inspector
- Light Microscopes
- Semiconductor Wafer & Flat Panel Display Inspection Microscopes
- AR Microscopes
- Industrial Stereo Microscopes
- Digital Cameras
- Image Analysis Software
- Microscope Objective Lenses for Industry
- OEM Microscope Components for Integration
- Industrial Microscope FAQ
- Customized Solutions
Knowledge
Learn about microscope
Back to Resources
The following pages give descriptions of optical terminology for the detailed understanding of microscopes.
Index
- Optical Microscopes
- Infinity-corrected Optical System
- Reflected Illumination
- Reflected Brightfield Observation
- Reflected Darkfield Observation
- Reflected Differential Interference Contrast (DIC) Observation
- Reflected Fluorescence Observation
- Polarized Observation
- IR (Infrared) Observation
- Objective Lens
- Working Distance (W.D.)
- Mechanical Tube Length
- Parfocal Distance
- Depth of Field
- Pupil Diameter and Beam Spot Diameter of Objective Lens
- Relationship Between Focal Distance and Magnification of Objective Lens
- Total Magnification (Eyepiece Observation, Video Monitor Observation)
- Numerical Aperture (N.A.)
- Resolving Power
- Field Number (F.N.) and Field of View (F.O.V.)
- Requirements for Ideal Image Formation
- Categorization of Aberrations
- Wavefront Aberration
- Strehl Ratio
Keywords
Microscope Types
Microscope Structures
Microscopy
Basic Terminology
Aberration
