Electronics

Olympus Solutions for Electronics

Electronics are getting smaller, and so are their components. Inspecting microcircuits, semiconductor wafers, and other electronics is challenging because even a small piece of debris can cause a malfunction.

Manufacturers use microscopes with high-quality optics to inspect soldered connections in circuits, the condition of wires in printed circuit boards, and to look for contaminants. In some applications, the roughness of the components used in a device is measured using noncontact laser confocal microscopes to ensure they meet strict standards.

5G Device Measurement and Inspection Solutions

Microscope Solutions for Semiconductor Manufacturing

Microscope Solutions for PCB Manufacturing

Microscope Solutions for Lithium-Ion Battery Manufacturing

More Resources

Blog

Mix Observation Methods to See More in Your Wafer Defect Inspection

Static Electricity and Surface Roughness in Films: An Experiment

Advantages of Laser Microscopes for Measuring the Roughness of Copper Foil used in 5G PCBs

Controlling Quality Control in Electronics Manufacturing Using PRECiV™ Software

A Smart Way to Control Contamination for High-Throughput Metrology and Inspection

5 Advantages of the DSX1000 Digital Microscope

What Is a Digital Microscope?

ASNT 2018 Wrap Up

From Macro to Micro: How Digital Microscopes are Changing Industrial Inspections

Toy Trouble: Detecting Hazardous Materials in a Popular Toy

Acquiring High-Quality Images Through Silicon Without Damaging the Finished Product

Using Image Analysis Software to Automatically Detect Particles in Cadmium Zinc Telluride

Consumer Product Testing Using Vanta Handheld XRF

The Trend Toward LED Illumination in Microscopy Applications

Under the Stereo Microscope

The Benefits of a Fully Motorized Microscope System

Making the Most of Köhler Illumination

What can an imaging database do for you?

Get the Most Out of Your Thickness Gauge with Instructional Videos

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Application Notes

プリント基板（PCB）における不良解析の課題と解析事例紹介

Using a High-Resolution Digital Microscope to Perform Highly Accurate Thickness Measurements of the Internal Layer of a Multilayer Ceramic Condenser

High-precision three-dimensional measurement : Measuring the shape of microchannels with a 3D laser microscope (Japanese only)

Measuring the Circuit Shape of a Printed Wiring Board Using a Digital Microscope

Inspecting Glass Fiber Peeling in a Printed Wiring Board’s Glass Epoxy Substrate—Clear Images Are Essential for Quality Control

Detecting Manufacturing Defects on Semiconductor Wafers Using a Digital Microscope

Acquiring Clear Images and Accurate Dimension Measurements of a Laminated Ceramic Capacitor Using a Digital Microscope

Measuring the Volume of Integrated Circuit Chipping After the Dicing Process Using a Digital Microscope

How a Digital Microscope’s Deep Focal Depth Enables the Complete Inspection of Connector Pins

Inspecting Bonding Wires Using a Digital Microscope

Inspecting the Cavity Profile of Xenon Difluoride (XeF2) Etched Silicon (Si) Wafers for Suspended Antenna-Coupled Nanothermocouples

Measuring the Profile of a Bonding Wire Ball

Measuring the Thickness of Photoresist Film

Height Measurement of Microscopic Bumps on an Integrated Circuit

Measuring the shape of scratches on vehicle-mounted camera lenses

Measuring the shape of an automotive millimeter-wave radar’s circuit board

Measuring the Layer Profiles of Thin-Film Solid-State Lithium-Ion Batteries Manufactured Using the Inkjet Technique

Measuring the Surface Roughness of a Lead Frame Die Pad

Measuring the Roughness of Lithium-Ion Battery Electrodes Using a Laser Microscope

Measuring the Surface Roughness of Lithium-Ion Battery Electrode Collectors

Using a microscope to inspect the solder wettability of mounting components

Observing the Surface Condition of Separators in Lithium-Ion Batteries Using a Scanning Probe Microscope (SPM) Combined with a Laser Microscope

Surface Roughness Evaluation of Memory Cards

Circuit Pattern Inspection on Wafer Samples

Using Image Analysis Software to Measure Throwing Power or PCB Copper Plating Thickness Uniformity

Wiring Inspections for Flexible Printed Circuit Boards (PCBs)

Au Area Ratio Measurement for Bonded Surfaces after Bump Abruption

Contaminants in Printed Circuit Board (PCB) Through-Holes

Dimensional measurement of embossed carrier tape for capacitors

Step measurement of transparent film applied to a glass surface

Evaluating the Coating on a Smartphone Housing / Film thickness measurement and 3D surface profile measurement using a laser microscope

Roughness Evaluation of the Inner Lead of a Lead Frame / Surface roughness measurement of a micro area using a laser microscope

Surface Profile Evaluation of Diffuser Plates for LCDs / Non-contact 3D shape measurement using a laser microscope

Evaluating the Shape of the Landing Zone Pattern and Contaminants on a Hard Disk / All-in-one system of optical, laser, and probe microscope capabilities provides seamless measurement from the millimeter to nanometer level.

Surface profile of the light guide plate for LCDs / Non-contact 3D shape measurement using a laser microscope

Quantitative Investigations of the Interconnect

Looking towards a Future of Affordable Solar Energy

Studying the Electro-mechanical Behavior of Thin Films

Surface Roughness Measurement of Flexible Print Substrate using the Olympus OLS4100 Laser Confocal Microscope

Evaluating the Contacting Terminals of Wafer Level Chip Size Packages (CSPs) using the Olympus OLS4100 Laser Confocal Microscope

Using the Olympus OLS5000 Laser Confocal Microscope to Measure the Surface Roughness of Printed Circuit Boards

Sectioning Analysis for Ball Grid Array (BGA) Surface Mounting of Semiconductor Package using the Olympus OLS5000 Laser Confocal Microscope

Setting standards in optical metrology at the PTB

Inspection of PGA packaging

BGA Cross Section Analysis

Semiconductor Bear Wafer Lasermark

Alternative Materials for Alternative Energy

Maximizing Data Recovery: Utilizing 3D Digital Laser Microscopy to Image Damaged Optical Media

The Benefits of Handheld XRF for Medical Device RoHS Compliance

The future of industrial quality control

Quilt Packaging: Lining Up an Array of Opportunities

HHXRF Analyzers for Screening Consumer Goods for Lead (Pb), Cadmium (Cd) and Other Metals

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Videos

RVI Tutorial Video Series—Inspection Management with the IPLEX™ NX Videoscope

IE Japan Seminar: DSX1000 Solution

IE Japan Seminar: Microscope Solution

IE Japan Seminar: Stereo Microscope and Digital Camera Solution

DSX1000: Demonstration Guaranteed The Accuracy and Repeatability

DSX1000: Demonstration Stiching Function

DSX1000: Demonstration Reproduction Function of Observation Conditions

DSX1000: Demonstration Various Observation Method With One Touch

DSX1000: Demonstration Best Image Function

DSX1000: Demonstration Free Angle Observation System

DSX1000: Demonstration Wide Field Range Observation from Macro to Micro

DSX1000: Demonstration Digest

OLS5000: Demonstration (Japanese only)

Olympus Solutions for the Electronics Industry

DSX1000: Promotion video

Vanta Technical Tutorial Series: Getting Started with Vanta PC Software

CIX100 - Technical Cleanliness Inspection System

Proper Setup of a Basic Stereo Microscope

BX3M Product Overview

Stereo Microscope Ergonomic Video

STM7 Measuring Microscope

EPOCH 650 Product Introduction

27MG Ultrasonic Thickness Gauge Introductory Video

Tech Tours - Olympus Industrial Microscopes

OLYMPUS Stream - Material Solution Modules

OLYMPUS Inspector Series - Product Overview

45MG Product Introduction Video

OLYMPUS Stream - Layer Thickness Solution

OLYMPUS Stream - Inclusion Worst Field Analysis (Non-metallic Inclusions)

GoldXpert - Introducing the GoldXpert

OLYMPUS Stream - 3D Imaging and Measurements

LEXT - Confocal Image Acquisition 2 of 2

LEXT - Confocal Image Acquisition 1 of 2

Overview of the 38DLP/39DLP Ultrasonic Thickness Gauge

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Infographics

Vanta Infographic

SZX Ergonomic Infographic

Solutions

Vanta for Manufacturing QA/QC

DELTA Alloys and Metals Handheld XRF Analyzer

Webinars

Webinar - XRF as Part of a Reasonable Testing Program for Consumer Products Regulations

Brochures

Vanta for PMI Brochure

Vanta Specifications

Microscope/Optical Metrology General Overview for Industrial Applications

Remote Visual Inspection Solutions General Overview

MX63/MX63L brochure

LC30 Microscope Digital Camera

Vanta Series Brochure

Motorized Microscope System BX61

BX53M/BXFM System Microscope

Phased Array (PA) Probes and Wedges Catalog

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White Papers

Application Considerations in Specifying High Frequency Ultrasonic Transducers

Roughness Measurement with LEXT, Laser Scanning Microscopes

Basic Principles of Laser Scanning Microscopes

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Tutorials

Ultrasonic Flaw Detection Tutorial

Phased Array Tutorial

Eddy Current Array Tutorial

Ultrasonic Thickness Gauge Tutorial

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FAQs

Ultrasonic Testing FAQ

Learn about microscope

Frequently Asked Transducer Questions

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Manuals

Vanta Family X-Ray Fluorescence Analyzer Getting Started Guide

Books

LEXT Roughness measurement guidebook