Exceptional Imaging for Challenging Inspection Applications

Better Clarity and Precision

The DP75 digital microscope camera delivers sharp, low-noise inspection images.

Improved multiple-axis color correction technology delivers outstanding color fidelity for vivid reproductions and the RGB color reproducibility needed for printed materials, LCD color filters, and other applications.

An image of printed paper

High-Resolution Images at Low Magnification

The camera’s pixel shifting make it possible to capture high-resolution images even at low magnification with a maximum resolution of 8192 × 6000, enabling you to add greater visual detail to your inspection reports.

Without pixel shifting (left) and with pixel shifting (right)

Find Flaws Fast

A sample’s appearance can vary depending on the quality of the material, surface conditions, or illumination methods. To show samples accurately, the camera’s live high dynamic range (HDR) combines several images taken at different exposures to correct for brightness differences on the sample’s surface. Live HDR provides high-fidelity images that show not only textures but also flaws and defects that were previously undetectable. Glare is also reduced for more comfortable observation.

Halation removal via HDR
(Sample: a printed circuit board(PCB))

Texture enhancement via HDR
(Sample: a printed circuit board (PCB))

Easy Fluorescence to Infrared Imaging using the Same Microscope Camera

Engineered to excel in various applications, the DP75 camera integrates numerous benefits with a high-sensitivity cooled CMOS sensor and a switchable infrared (IR) cut filter. Benefits include:

• Covers a wide range of wavelengths: the DP75 supports wavelengths from the visible light up to 1000 nm, enabling you to capture exceptional quality brightfield, darkfield, MIX (brightfield+darkfield), polarization, DIC, fluorescence, and NIR* observation images.
• Clear fluorescence images with minimal noise: capture high-quality images even if the fluorescence is weak, which is helpful in applications such as examining resist residues.

_{* Requires a microscope system for NIR observation}

A MIX (fluorescence+darkfield) observation image of a photoresist residue on a semiconductor wafer

A polarized observation image of a part of mineral

A brightfield observation image of a flexible board.

A NIR observation image of a flexible board.